Universal tester to handler docking plate

ABSTRACT

An apparatus and method for docking testers to handlers during an integrated circuit electrical testing process is disclosed. A universal docking plate is provided to connect one or more of a plurality of different testers to a handler, and/or vice-versa, such that multiple docking plates for every different tester-handler combination are not required. This is accomplished by having different groupings of mounting holes on the universal docking plate, with each grouping corresponding to a separate tester. In addition to differing groupings of mounting holes being located on the same universal mounting plate, one or more adaptors may be provided with each grouping of mounting holes to facilitate the mounting of any particular tester to the mounting plate, and ultimately the handler.

TECHNICAL FIELD

The present invention relates generally to an apparatus and method forintegrated circuit (“IC”) electrical testing, and more specifically toan apparatus and method for docking testers to handlers during an ICelectrical testing process.

BACKGROUND

Semiconductor wafer fabrication involves complex manufacturing processesto produce integrated circuits on the surface of silicon wafers, andultimately chips and other semiconductor devices. To ensure the qualityof the integrated circuits produced on these wafers and chips, varioustesting methods have been devised to find defects, abnormalities andother items on the wafer, chip or other semiconductor device. Severalsuch methods involve the placement of testing circuitry at variouslocations on the unit to be tested and the use of test signals todetermine the functionality of the circuitry. Before individual devicesor chips are approved and passed on, for example, they are subjected tofinal testing, one by one, by a suitable automatic apparatus. This testtypically comprises various programmed electrical measurements that areintended to ascertain whether each device or chip conforms to certaindesired functional requirements.

The generic use of device “testers” and “handlers” is well known in thesemiconductor industry as tools for the electrical testing of ICcomponents during the manufacture of semiconductor wafers, devices andchips. An IC device tester is typically an expensive piece of computingequipment that transmits test signals via tester probes to an IC deviceand also processes signals received from the IC device. An IC devicehandler is typically an expensive robot adapted to move IC devices fromone location to a test location where the tester probes are located, andthen back to the original location or, alternatively, some otherlocation. Apparatuses and methods for utilizing such handlers andtesters are well known, and instances of such apparatuses and methodscan be found, for example, in U.S. Pat. Nos. 5,489,852; 5,945,837; and6,118,286, for example, all of which are incorporated herein byreference in their entirety.

Device testers and device handlers are typically purchased by end ICdevice manufacturers from different companies. The choice of aparticular device tester depends upon a number of factors, such as, forexample, the number of pins associated with the IC manufacturer's ICdevices. That is, the device tester must have a number of tester probesthat is equal to or greater than the number of pins utilized by the mostcomplex IC device to be tested by that tester. For example, dependingupon the devices to be tested, it may be desirable to have a testercapable of testing a maximum of 50 leads, 100 leads, or even 200 leads,among others. In addition, there are various test capabilities that mayor may not be present on a given tester. These include the ability toconduct digital IC tests, analog IC tests, mixed signal IC tests andhigh frequency IC tests, among others. Due to these differing needsamong IC device manufacturers, most IC device tester manufacturers thusmake a plurality of different tester types or models.

Device handlers are selected based on a number of factors as well, suchas, for example, the required throughput (i.e., the rate at which ICdevices are to be tested) and the specific function or functions to beperformed. Specific functions include the ability to process IC deviceswith, for example, a TSSOP package having 14 to 28 leads, a TSSOPpackage having 32 to 56 leads, a SOIC package having 14 to 44 leads, aQFP package having 200 leads, and a MSOP package having 8 leads, amongothers. Although many handlers may be configured to be compatible with avariety of package specifications, typically only one configuration ispossible at a time, with significant effort and down time being requiredto reconfigure the handler to a different configuration. Additionally,many IC devices require more than one type of test during the testingprocessing, which in turn requires more than one type of tester and/orhandler. For at least the foregoing reasons, a plurality of differenttypes of handlers are typically used by many IC device manufacturers,with most IC device handler manufacturers thus typically making aplurality of different handler types or models.

Testers are made by manufacturers such as, for example, Teradyne, Inc.of Boston Mass. and Eagle Test Systems of Mundelein, Ill., among others.In addition to there being many different manufacturers of IC devicetesters, each manufacturer will typically make several different kindsor models of testers. Such makes and models include, for example, theTeradyne J750, Teradyne Catalyst, Teradyne A567, Teradyne A575, TeradyneA530, Teradyne A535, Eagle E500, Eagle E364, and Eagle E200, amongothers. Handlers are made by manufacturers such as, for example,Multitest GmbH of Rosenheim, Germany; Yokogawa Electric Corporation ofTokyo, Japan; Delta Design of San Diego, Calif.; and Shinano ElectronicsCompany Ltd. (Synax) of Matsumoto, Japan, among others. As in the caseof testers, each handler manufacturer will typically make severaldifferent kinds or models of handlers. Such makes and models include,for example, the Multitest MT9918, Multitest MT9308, Yogokawa 9730,Delta 1688, Delta Turbo, and Synax SX1701, among others. Although theforegoing have been provided as listed examples, it is understood thatmany other manufacturers, makes and models of testers and handlers alsoexist, and that such entities and devices may increase or change in thefuture.

For typical IC testing to take place, a particular handler needs to becoupled or docked with a particular tester, such that a specific testsite on the handler mates with a specific location on the tester. Thus,in addition to a device tester and a device handler, most conventionalIC device testing systems typically include some form of interfacestructure as well. This interface structure may be connected to thetester probes, and typically includes a test area (i.e., socketarrangement) for receiving IC devices from the device handler. Inaddition, most conventional interface structures comprise a customizeddocking plate that is specially adapted for a particular make and modelof IC device tester and a particular make and model of IC devicehandler. Customization is required due to the differing mountingrequirements for each different tester and likewise for each differenthandler, as there exists no industry-wide standardization in thisregard. Such docking plates can be made by the tester manufacturer orhandler manufacturer, but are often custom made by the end IC devicemanufacturer to interface between a particular make and model of ICdevice tester and a particular make and model of IC device handler.

Turning now to FIG. 1, an exemplary handler used for the electricaltesting of an integrated circuit during a commercial chip manufacturingprocess is illustrated in perspective view. Handler 10 (which is aMultitest MT9308, although the particular make and model is notimportant for these generic illustrative purposes) comprises an inputloader 11, a test site 12, and output tubes 13. In general, an IC deviceto be tested (not shown) is loaded into a tube (not shown), which isthen placed at the input loader 11 of the handler 10. The handler thentransfers this IC device in automated fashion to the test site 12, whichcomprises a window within the handler, and arranges the IC device into aposition on a test socket to be tested by an IC device tester (notshown). The handler then issues a start signal to the tester, whereuponthe tester tests the IC device, and the tester then sends an “accept” or“reject” signal to the handler. The handler then sorts the IC deviceaccording to this signal from the tester, and the IC device is sent tothe appropriate “accept” or “reject” tube among output tubes 13.

Referring to FIGS. 2 and 3, the exemplary handler of FIG. 1 and anaccompanying tester used for the electrical testing of an integratedcircuit during a commercial chip manufacturing process are illustratedin side perspective views. In FIG. 2, handler 10 is shown in closeproximity to, but undocked with tester 20 (which is a Teradyne Catalystin FIG. 2, although the particular make and model is not important forthese generic illustrative purposes). Mounted to handler 10 about thetest site 12 is a conventional docking plate 30, which is particularlyadapted for this particular handler and this particular tester (i.e. aMultitest MT9308 and a Teradyne Catalyst in this particularillustration). Tester 20 typically comprises a test head 21 havingmultiple electrical leads or probes, a support frame or structure 22 andone or more electrical connections 23 from the test head to one or morecontrol units. In FIG. 3, tester 20 is shown as docked to handler 10 viaconventional mounting plate 30, such that standard electrical testingcan take place.

Turning now to FIG. 4, an exemplary conventional docking plate used fordocking a tester to a handler during the electrical testing of anintegrated circuit during a commercial chip manufacturing process isillustrated in front perspective view. Continuing somewhat with theforegoing illustrative example, conventional docking plate 30 isspecifically configured to couple or dock a Multitest MT9308 handler toan Eagle ETS500 tester. Accordingly, docking plate 30 comprises variousholes 31 and slots 32 of specific sizes and locations, in order tofacilitate such a docking. While some of these holes and/or slots arerequired as a result of the specific handler being docked (i.e., aMultitest MT9308, or other similar Multitest 93xx model type), othersare required as a result of the specific tester being docked (i.e., anEagle ETS500). In the end, the sum of the particular size and shape ofthe docking plate, as well as the size and location of all the variousholes and slots in the docking plate, is a direct result of thecustomization of the docking plate to dock a particular tester to aparticular handler.

Although the foregoing generic illustrative example relates to onespecific tester, one specific handler, and one specific conventionaldocking plate, this example will be readily understood by one skilled inthe art to be applicable to many other makes and models of testers andhandlers, with one or more variations, depending on the particular makesand models used. Because more than one type of tester and/or more thanone type of handler are typically required for conventional testingoperations, and because a typical IC device manufacturer tends to makemany different kinds of IC devices, however, many different conventionaldocking plates are needed during all testing processes performed by aparticular IC device manufacturer. Each different conventional dockingplate typically has a unique shape and set of mounting holes, wherebythis shape and these mounting holes are specifically designed to coupleone particular type of handler to one particular type of tester. Thus,for the case of five different handlers and five different testers,twenty-five separate conventional docking plates are needed in order foreach handler to be able to couple or dock to each different tester.

Not only does this need for multiple docking plates result in asignificant increase in hardware costs, it also results in significantadditional expenditures of the time that is required to perform alldesired electrical test functions for all manufactured IC devices. Thisundesirable increase in the time required to use a different dockingplate to set up each electrical test results in an increase in laborcosts and a decrease in manufacturing efficiencies.

Accordingly, there exists a need for an apparatus and method for dockingtesters to handlers during an IC electrical testing process thatinvolves fewer docking plate changeovers, and in particular for such anapparatus and method to result in fewer docking plates needed tocomplete all desired electrical tests on any and all IC devices beingmanufactured.

SUMMARY

It is an advantage of the present invention to provide an apparatus andmethod for for docking testers to handlers during an IC electricaltesting process. According to one embodiment of the present invention,the provided apparatus and method involve the elimination of the typicalneed for multiple docking plates corresponding to each different handlerto tester combination. This is accomplished by providing a universaldocking plate capable of mounting more than one tester to each handler,more than one handler to each tester, or both. This universal dockingplate contains a plurality of mounting hole groupings, with eachmounting hole grouping corresponding to a different tester and/ordifferent handler. In addition, one or more adaptors may be necessary tofacilitate the connection at each docking hole grouping and testerinterface.

Other apparatuses, methods, features and advantages of the inventionwill be or will become apparent to one with skill in the art uponexamination of the following figures and detailed description. It isintended that all such additional systems, methods, features andadvantages be included within this description, be within the scope ofthe invention, and be protected by the accompanying claims.

BRIEF DESCRIPTION OF THE DRAWINGS

The included drawings are for illustrative purposes and serve only toprovide examples of possible structures for the disclosed inventiveuniversal tester to handler docking plate. These drawings in no waylimit any changes in form and detail that may be made to the inventionby one skilled in the art without departing from the spirit and scope ofthe invention.

FIG. 1 illustrates in perspective view an exemplary handler used for theelectrical testing of an integrated circuit during a commercial chipmanufacturing process.

FIG. 2 illustrates in side perspective view the exemplary handler ofFIG. 1 and an accompanying tester used for the electrical testing of anintegrated circuit during a commercial chip manufacturing process.

FIG. 3 illustrates in an alternative side perspective view the exemplarytester and handler of FIG. 2.

FIG. 4 illustrates in front perspective view an exemplary conventionaldocking plate used for docking a tester to a handler during theelectrical testing of an integrated circuit during a commercial chipmanufacturing process.

FIG. 5 illustrates in front perspective view an exemplary universaldocking plate according to one embodiment of the present invention.

FIG. 6 illustrates in front perspective view the exemplary universaldocking plate of FIG. 5 mounted to the exemplary handler of FIG. 1according to one embodiment of the present invention.

FIG. 7 illustrates in front perspective view an exemplary universaldocking plate adaptor according to one embodiment of the presentinvention.

FIG. 8 illustrates in front perspective view the exemplary universaldocking plate adaptor of FIG. 7 coupled with the exemplary universaldocking plate of FIG. 5 according to one embodiment of the presentinvention.

FIG. 9 illustrates in front perspective view an alternative exemplaryuniversal docking plate adaptor according to one embodiment of thepresent invention.

FIG. 10 illustrates in front perspective view the exemplary alternativeuniversal docking plate adaptor of FIG. 9 coupled with the exemplaryuniversal docking plate of FIG. 5 according to one embodiment of thepresent invention.

FIG. 11 illustrates in front perspective view yet another alternativeexemplary universal docking plate adaptor according to one embodiment ofthe present invention.

FIG. 12 illustrates in front elevation view the exemplary alternativeuniversal docking plate adaptor of FIG. 11 coupled with the exemplaryuniversal docking plate of FIG. 5, with both of these items mounted tothe exemplary handler of FIG. 1 according to one embodiment of thepresent invention.

DETAILED DESCRIPTION

An example application of an apparatus and method according to thepresent invention is described in this section. This example is beingprovided solely to add context and aid in the understanding of theinvention. It will thus be apparent to one skilled in the art that thepresent invention may be practiced without some or all of these specificdetails. In other instances, well known process steps have not beendescribed in detail in order to avoid unnecessarily obscuring thepresent invention. Other applications are possible, such that thefollowing example should not be taken as limiting.

In the following detailed description, references are made to theaccompanying drawings, which form a part of the description and in whichare shown, by way of illustration, specific embodiments of the presentinvention. Although these embodiments are described in sufficient detailto enable one skilled in the art to practice the invention, it isunderstood that these examples are not limiting; such that otherembodiments may be used, and changes may be made without departing fromthe spirit and scope of the invention.

One advantage of the present invention is the elimination or reductionof the need for multiple docking plates according to the variouscombinations of testers and handlers that may be required in one ormultiple series of IC electrical testing processes. Such an eliminationor reduction results in a net savings to the manufacturer, at least inits costs of manufacturing equipment.

Another advantage of the present invention is the inherent increase inmanufacturing efficiency resulting from this reduction or elimination ofmultiple docking plates, as the added time and effort required fordocking plate changes is also reduced or eliminated. Also eliminated isthe need for separate engineering drawings and techniques formanufacturing a wide variety of different conventional docking plates,as well as the need for separate designations, inventory lists, storageareas, and the like that are inherent to similar but distinct equipmentor parts.

Newer technologies and innovations have advanced the field of IC devicemanufacturing rapidly in the past few decades, offering newopportunities for manufacturers to produce products such as IC devicesand chips more rapidly and efficiently. The present invention adds tothe advancement of this field by providing a new apparatus and methodfor docking testers to handlers during an IC electrical testing processwithout the need for multiple docking plates and the added time andexpenses involved with such multiple docking plates.

Turning now to FIG. 5, an exemplary universal docking plate according toone embodiment of the present invention is illustrated in frontperspective view. Universal docking plate 100 comprises numerous shapes101, contours 102, holes 103, grooves 104, indentations and the like,all configured in such a manner so as to be capable of coupling one ormore different types of handlers to one or more different types oftesters. Thus, while a conventional docking plate is only capable ofcoupling one type of tester to one type of handler, such that the sum ofall types of handlers and all types of testers that can be coupled bythe conventional docking plate is only two, the universal docking plateof the present invention is capable of coupling more than one type oftester and/or more than one type of handler, such that the sum of alltypes of handlers and all types of testers that can be coupled by theinventive universal docking plate is at least three. In this sense, theterm “universal” as used herein does not mean that the inventive dockingplate can couple all types of testers to all types of handlers. Rather,the term “universal” as used herein simply designates that the inventivedocking plate can couple more types of testers and/or more types ofhandlers than a conventional docking plate.

Similarly, as used throughout this description and in the appendedclaims, the term “type of tester” is refers only to all IC electricaltesting testers having substantially the same mounting or couplingrequirements, such that the same conventional docking plate may be usedto dock such testers with a given IC electrical testing handler.Differing test features, capabilities, costs, and all other parametersare irrelevant for purposes of the term “type of tester” as used herein.For example, while a Teradyne A530 and a Teradyne A535 are technicallytwo different models of testers, they are both similar enough such thatboth can be mounted to a given handler with the same conventionaldocking plate. In this sense then, these two testers, as well as anyother similarly related tester model, are the same “type of tester” forthe purposes contained herein. Likewise, as used throughout thisdescription and in the appended claims, the term “type of handler”refers only to all IC electrical testing handlers having substantiallythe same mounting or coupling requirements, such that the sameconventional docking plate may be used to dock such handlers with agiven IC electrical testing tester. As a further illustrative example,while a Multitest MT9308 and a Multitest MT9918 are technically twodifferent models of handlers, they are both similar enough such thatboth can be mounted to a given tester with the same conventional dockingplate. Similarly, these two handlers, as well as any other MultitestMT9000 series or other similarly related handler model, are the same“type of handler” for the purposes contained herein.

Universal docking plate 100 has been configured to couple one or moretypes of integrated circuit electrical testing testers to one or moretypes of integrated circuit electrical testing handlers, such that thesum of all possible types of testers and all possible types of handlersthat can be coupled by said docking plate is at least three. In fact,the sum of all possible types of testers and all possible types ofhandlers that can be coupled by this particular universal docking plateis actually eleven, which is the result of this docking plate beingcompatible with at least seven different types of testers and at leastfour different types of handlers. In particular, the different types oftesters that can be coupled by universal docking plate 100 include: 1)the Teradyne J750 and other testers of the same type; 2) the TeradyneCatalyst and other testers of the same type; 3) the Teradyne A567,Teradyne A575 and other testers of the same type; 4) the Teradyne A530,Teradyne A535 and other testers of the same type; 5) the Eagle E500 andother testers of the same type; 6) the Eagle E364 and other testers ofthe same type; and 7) the Eagle E200 and other testers of the same type.Similarly, the different types of handlers that can be coupled byuniversal docking plate 100 include: 1) the Multitest MT9918, MultitestMT9308 and other handlers of the same type; 2) the Yogokawa 9730 andother handlers of the same type; 3) the Delta 1688, Delta Turbo andother handlers of the same type; and 4) the Synax SX1701 and otherhandlers of the same type. Although the universal docking plate 100illustrated and described herein has been limited to the specifictesters and handlers listed above for practical reasons and purposes ofillustration, it will be readily understood by one skilled in the artthat other tester types and/or handler types may be added and/orsubstituted for one of more of the specific types listed here, and suchother additions and/or substitutions are specifically contemplated bythe present invention.

As a result of its compatibility with so many different types of testersand so many different types of handlers, use of the particular inventiveuniversal docking plate described herein results in the elimination ofthe typical need for 25 different conventional docking platescorresponding to each different combination of one of the five listedtypes of testers to one of the five listed types of handlers. This isgenerally accomplished through incorporating the varying coupling andmounting requirements of different types of testers and handlers ontothe relatively complex inventive universal docking plate. Universaldocking plate 100 contains a plurality of mounting hole groupings 110,wherein each mounting hole grouping corresponds to a different testerand/or a different handler. Although the term “mounting hole grouping”has been used herein, it will be readily understood that such a groupingincludes not only holes, but also any shapes, contours, grooves,indentations and other features that are required for the mounting of aspecific tester or handler. While any particular conventional dockingplate will thus have only two such mounting hole groupings, one for itsparticular tester and one for its particular handler, the inventiveuniversal docking plate will have at least three such mounting holegroupings. In fact, the number of mounting hole groupings in exemplaryuniversal docking plate 100 is actually on the order of eleven, asdetailed herein.

In this specific embodiment illustrated as universal docking plate 100,the exemplary mounting hole grouping actually designated as 110,individual elements of which are designated separately as individualmounting indentations and holes 111, comprises the mounting indentationsand holes that are required for a Teradyne J750 and other testers of thesame type. Another mounting hole grouping (each further mounting holegrouping not also being designated as 110 for purposes of clarity)comprises a grouping of individual mounting holes 112 and 113 that arerequired for an Eagle ETS364 and other testers of the same type. Inparticular, mounting holes 112 represent those required for ETS364 dowelpins, while separate patterns of individual mounting holes 113 are thosethat are required for adding ETS364 gussets, as would be readilyunderstood by those skilled in the art. In terms of the Eagle ETS364then, the combination of all mounting holes 112 and all separatepatterns of individual mounting holes 113 comprises a single “mountinghole grouping.” Next, another mounting hole grouping comprisesindividual mounting holes 114, which are those that are required for thedowel pins of a Teradyne Catalyst and other testers of the same type.Furthermore, individual mounting holes 115 are those that are requiredfor the dowel pins of a Teradyne A567, Teradyne A575 and other testersof the same type. Lastly, in terms of testers, individual circularindentations 116 are those that are required for the mounting of anEagle E500 and other testers of the same type.

Similarly, universal docking plate 100 comprises several mounting holegroupings corresponding to the different types of handlers that can becoupled or “mounted” by this universal docking plate. In particular,individual mounting holes 117 comprise those that are required forcoupling with a Multitest MT9918, Multitest MT9308 and other handlers ofthe same type. Likewise, individual mounting holes 118 comprise thosethat are required for mounting with a Yogokawa 9730 and other handlersof the same type. In addition, individual docking holes 119 andindividual longitudinal grooves 120 comprise those features that arerequired for mounting, docking or coupling with a Delta 1688, a DeltaTurbo and other handlers of the same type. Finally, for purposes of theexemplary list of types of handlers accounted for by the illustrationdescribed herein, individual mounting holes 121 comprise those that arerequired for mounting with a Synax SX1701 and other handlers of the sametype.

While the many variations in the various holes, grooves, indentationsand the like that are required for mounting various testers or handlerscan be handled by including any of such features located generallyaround a perimeter of a universal docking plate, as detailed above, theproliferation of such varying features, as well as variances in thedetails of the test site and test site components typically render suchall-encompassing inclusions impractical towards the center of auniversal docking plate. For example, while a test site opening may beonly several inches wide for some handlers, the corresponding dimensionin other handlers may be up to and in excess of one foot or more, and itmay not be practical to have a large test site opening in the dockingplate for handlers with smaller test sites. According to a particularlypreferred embodiment of the present invention, such substantialvariances within and near the test sites in different types of handlersand testers are compensated for by utilizing one or more readilyattachable and removable adaptors in conjunction with the universaldocking plate, with such adaptors being specifically adapted forparticular handlers and/or testers.

Referring again to FIG. 5, universal docking plate 100 comprises acentrally removed portion or opening 130 about what will become the testsite area. This central opening 130 is generally large enough such thatall adaptors that are to be used in conjunction with universal dockingplate 100 can be made to fit within opening 130 and secured to theuniversal docking plate. To this end, a recessed shelf 131 ringing theopening and securing holes 132 are utilized as standardized means forfastening or mounting each adaptor to the universal docking plate,although other similar mounting means will be readily understood bythose skilled in the art. That is, while each conventional docking platewill have differing mounting requirements and procedures, the processfor mounting most particularized adaptors to the universal docking platewill remain substantially similar. Although the use of suchinterchangeable adaptors may in some instances result in generallyundesirable additional parts and/or switch over time when changingtesters or handlers, the effect of such additional parts and/or time issignificantly minimized over what is typically experienced in the casesof fully customized conventional docking plates, at least due tosubstantial reductions in the size and complexity of these adaptor, aswell as in the substantially similar mounting requirements for eachadaptor with respect to the universal docking plate.

Referring next to FIG. 6, the exemplary universal docking plate of FIG.5 is illustrated in front perspective view as having been mounted to theexemplary handler of FIG. 1, according to a preferred embodiment of thepresent invention. As discussed in detail above, universal docking plate100 comprises a plurality of mounting hole groupings 110, with each suchgrouping corresponding to all features that are required to mount aparticular tester or handler. In the event of a Multitest 9308 handler10, all individual mounting holes 117 corresponding to this handler typehave been used to mount or affix the universal docking plate to thehandler. As also discussed in detail above, universal docking plate 100comprises a central opening 130 that is set about the test site 12 ofthe handler 10. As illustrated, universal docking plate 100 has beencompletely and firmly mounted to handler 10, and only requires themounting of the particular adaptor component or components thatcorrespond to whatever tester is next in line to be used with thishandler.

Turning now to FIG. 7 an exemplary universal docking plate adaptoraccording to one embodiment of the present invention is illustrated infront perspective view. Adaptor 200 is specifically constructed toaccommodate all required features for a Teradyne J750 or similar typetester that the universal docking plate does not account for itself, aswell as to mate with universal docking plate 100. Adaptor 200 comprisesa plurality of holes 201 and 202 that are required in the central ortest site region of a docking plate by the Teradyne J750 or similar typetester. In addition, adaptor 200 also comprises a recessed shelf 203 andseveral tabs 204 ringing the interior opening 230, as also required by aTeradyne J750 or similar type of tester. Finally, mounting holes 232 arelocated along the outer perimeter of adaptor 200 in a spaced fashionthat corresponds to the mating requirements for adaptor 200 anduniversal docking plate 100. Referring to FIG. 8 the exemplary universaldocking plate adaptor of FIG. 7 is shown as having been coupled or matedwith the exemplary universal docking plate of FIG. 5 according to oneembodiment of the present invention in front perspective view. Thespecifics of both universal docking plate 100 and adaptor 200 have beenprovided in full detail above, and this illustration merely providesadditional context for the interaction between the universal dockingplate and adaptor as they are coupled together.

Turning now to FIG. 9, another exemplary universal docking plate adaptoraccording to another embodiment of the present invention is similarlyillustrated in front perspective view. Adaptor 300 is specificallyconstructed to accommodate the required features for a Teradyne A567,Teradyne A575, Teradyne A530, Teradyne A535 or any other similar typetester (collectively a “Teradyne A5xx”) that the universal docking platedoes not account for itself, as well as to mate with universal dockingplate 100. Furthermore, adaptor 300 is also specifically constructed toaccommodate required features for an Eagle ETS200 tester, as detailedherein.

Adaptor 300 comprises a plurality of various holes 301, slots 302, acentral opening 330, and other unique features that are required in thecentral or test site region of a docking plate by a Teradyne A5xx orEagle ETS200. In particular, adaptor 300 comprises mounting holes 310,which are used for the dowel pins of a Teradyne A530 or a Teradyne A535tester. Furthermore, adaptor 300 also comprises additional mountingholes 311, which are used for the dowel pins of an Eagle ETS200 tester.As in the case of adaptor 200, adaptor 300 also comprises mounting holes332 located along its outer perimeter in a spaced fashion thatcorresponds to the mating requirements for adaptor 300 and universaldocking plate 100.

Referring to FIG. 10 the exemplary universal docking plate adaptor ofFIG. 9 is shown as having been coupled or mated with the exemplaryuniversal docking plate of FIG. 5 according to another embodiment of thepresent invention in front perspective view. As in the case of adaptor200, the specifics of both universal docking plate 100 and adaptor 300have been provided in full detail above, and this illustration merelyprovides additional context for the interaction between the universaldocking plate and adaptor as they are coupled together.

Turning now to FIG. 11, yet another exemplary universal docking plateadaptor according to another preferred embodiment of the presentinvention is illustrated in front perspective view. Adaptor 400, whichis specifically designed to work in conjunction with an adaptor similarto adaptor 200 or adaptor 300 described above, is constructed toaccommodate some of the additional required features for an Eagle ETS200or any other similar type tester, such features as will be known by oneskilled in the art. Adaptor 400 generally comprises a frame structure401, a plurality of connectors 402, a plurality of cable supportopenings 403, and other unique features that are required in the centralor test site region of a docking plate for an Eagle ETS200 or othersimilar type tester.

Referring to FIG. 12 the exemplary universal docking plate adaptor ofFIG. 11 is shown in front perspective view as having been coupled ormated with the exemplary universal docking plate of FIG. 5, with both ofthese items having been mounted to the exemplary handler of FIG. 1according to another embodiment of the present invention. As in the caseof adaptors 200 and 300 above, the specifics of both universal dockingplate 100 and adaptor 400 have been provided in full detail above, andthis illustration merely provides additional context for the interactionbetween the universal docking plate and adaptor as they are coupledtogether.

Although the foregoing invention has been described in detail by way ofillustration and example for purposes of clarity and understanding, itwill be recognized that the above described invention may be embodied innumerous other specific variations and embodiments without departingfrom the spirit or essential characteristics of the invention. Certainchanges and modifications may be practiced, and it is understood thatthe invention is not to be limited by the foregoing details, but ratheris to be defined by the scope of the appended claims.

What is claimed is:
 1. An apparatus, comprising: a docking plateconfigured to couple one or more types of integrated circuit electricaltesting testers to one or more types of integrated circuit electricaltesting handlers, wherein the sum of all possible types of testers andall possible types of handlers that can be coupled by said docking plateis at least three.
 2. The apparatus of claim 1, wherein said dockingplate comprises a plurality of mounting holes, said plurality ofmounting holes corresponding to a plurality of different types ofhandlers, a plurality of different types of testers, or both.
 3. Theapparatus of claim 2, wherein at least a portion of said plurality ofmounting holes corresponds to a plurality of different types of testers.4. The apparatus of claim 3, wherein at least a portion of saidplurality of mounting holes corresponds to at least seven differenttypes of testers.
 5. The apparatus of claim 2, wherein at least aportion of said plurality of mounting holes corresponds to a pluralityof different types of handlers.
 6. The apparatus of claim 2, wherein atleast a portion of said plurality of mounting holes belongs to aplurality of particular groupings of mounting holes.
 7. The apparatus ofclaim 6, wherein each particular grouping of mounting holes correspondsto a different type of tester or handler.
 8. The apparatus of claim 1,wherein the sum of all possible types of testers and all possible typesof handlers that can be coupled by said docking plate is at least four.9. The apparatus of claim 1, wherein the sum of all possible types oftesters and all possible types of handlers that can be coupled by saiddocking plate is at least eleven.
 10. The apparatus of claim 1, furthercomprising: one or more adaptors configured to couple said docking plateto said one or more types of integrated circuit electrical testingtesters.
 11. The apparatus of claim 10, wherein each of said one or moreadaptors corresponds to a different type of tester.
 12. A method oftesting an integrated circuit, comprising: selecting a first integratedcircuit electrical testing tester adapted to test said integratedcircuit; selecting a first integrated circuit electrical testing handleradapted to locate said integrated circuit into a position to be tested;and coupling said first integrated circuit electrical testing handler tosaid first integrated circuit electrical testing tester with a dockingplate, wherein said docking plate is configured to couple one or moretypes of integrated circuit electrical testing testers to one or moretypes of integrated circuit electrical testing handlers, wherein the sumof all possible types of testers and all possible types of handlers thatcan be coupled by said docking plate is at least three.
 13. The methodof claim 12, wherein the sum of all possible types of testers and allpossible types of handlers that can be coupled by said docking plate isat least four.
 14. The method of claim 12, wherein the sum of allpossible types of testers and all possible types of handlers that can becoupled by said docking plate is at least eleven.
 15. The method ofclaim 12, wherein said docking plate comprises a plurality of mountingholes, said plurality of mounting holes corresponding to a plurality ofdifferent types of handlers, a plurality of different types of testers,or both.
 16. The method of claim 15, wherein at least a portion of saidplurality of mounting holes corresponds to a plurality of differenttypes of testers.
 17. The method of claim 15, wherein at least a portionof said plurality of mounting holes belongs to a plurality of particulargroupings of mounting holes.
 18. The method of claim 12, furtherincluding the step of: selecting a first adapter, said first adapterconfigured to couple said docking plate to said first integrated circuitelectrical testing tester.
 19. The method of claim 12, further includingthe steps of: selecting a second integrated circuit electrical testingtester adapted to test said integrated circuit; and coupling said firstintegrated circuit electrical testing handler to said second integratedcircuit electrical testing tester with said docking plate.
 20. Anapparatus, comprising: a coupling means for coupling one or more typesof integrated circuit electrical testing testers to one or more types ofintegrated circuit electrical testing handlers, wherein the sum of allpossible types of testers and all possible types of handlers that can becoupled by said coupling means is at least three.
 21. A docking plateconfigured to couple at least one integrated circuit electrical testingtester to at least one integrated circuit electrical testing handler,said docking plate comprising: a first set of one or more couplingfeatures adapted to facilitate the coupling of a first type ofintegrated circuit electrical testing handler to a first type ofintegrated circuit electrical testing tester, wherein said handlercomprises a robot adapted to move integrated circuit devices from onelocation to a test location, and wherein said tester comprises a pieceof computing equipment that transmits test signals via tester probes toan integrated circuit device and also processes signals received fromthe integrated circuit device; and a second set of one or more couplingfeatures adapted to facilitate the coupling of either a second type ofintegrated circuit electrical testing tester to said first type ofintegrated circuit electrical testing handler or said first type ofintegrated circuit electrical testing tester to a second type ofintegrated circuit electrical testing handler, wherein at least aportion of said second set of one or more coupling features is distinctfrom said first set of one or more coupling features.
 22. The dockingplate of claim 21, wherein said first set of one or more couplingfeatures comprises one or more items selected from the group consistingof shapes, contours, holes, grooves and indentations.
 23. The dockingplate of claim 21, wherein the sum of all possible types of testers andall possible types of handlers that can be coupled by said docking plateis at least three.
 24. The docking plate of claim 23, wherein the sum ofall possible types of testers and all possible types of handlers thatcan be coupled by said docking plate is at least eleven.
 25. The dockingplate of claim 21, wherein: said first type of integrated circuitelectrical testing tester is selected from the group consisting of aTeradyne J750, a Teradyne Catalyst, a Teradyne A567 or Teradyne A575, aTeradyne A530 or Teradyne A535, an Eagle E500, an Eagle E364, and anEagle E200; said first type of integrated circuit electrical testinghandler is selected from the group consisting of a Multitest MT9918 orMultitest MT9308, a Yogokawa 9730, a Delta 1688 or Delta Turbo, and aSynax SX1701; or both.